DESIGN AND OPERATION OF A VARIABLE TEMPERATURE SCANNING TUNNELLING MICROSCOPE

被引：26
|
作者：
LYDING, JW [1 ]
SKALA, S [1 ]
HUBACEK, JS [1 ]
BROCKENBROUGH, R [1 ]
GAMMIE, G [1 ]
机构：
[1] UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷
关键词：
D O I：
10.1111/j.1365-2818.1988.tb01398.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：371 / 378
页数：8
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