THICKNESS-DEPENDENT OSCILLATORY BEHAVIOR OF RESISTIVITY AND HALL COEFFICIENT IN THIN SINGLE-CRYSTAL BISMUTH FILMS

被引：50
|
作者：
DUGGAL, VP
RUP, R
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1969年 / 40卷 / 02期
关键词：
D O I：
10.1063/1.1657426
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：492 / &
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