PREPARATION OF LARGE-AREA ELECTRON-TRANSPARENT SAMPLES FROM SILICON DEVICES

被引：0
|
作者：
DAS, G [1 ]
ONEIL, NA [1 ]
机构：
[1] IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
来源：
SOLID STATE TECHNOLOGY | 1974年 / 17卷 / 08期
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：29 / 31
页数：3
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