共 50 条
- [1] Post-cure die attach delamination 1996 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, 1996, 2920 : 162 - 167
- [4] Effects of Die-Attach Voids on the Thermal Impedance of Power Electronic Packages IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2017, 7 (10): : 1608 - 1616
- [5] In-situ cure shrinkage measurement of die attach and underfill materials 2016 17TH INTERNATIONAL CONFERENCE ON THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS (EUROSIME), 2016,
- [7] EVALUATION OF LOW-TEMPERATURE SNAP-CURE DIE ATTACH MATERIALS IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING, 1994, 17 (01): : 91 - 96
- [8] SHRINKAGE OF POST-CURE DIE ATTACH ADHESIVES DURING ISOTHERMAL STORAGE INTERNATIONAL TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC MICROSYSTEMS, 2015, VOL 3, 2015,
- [10] Effect of voids on crack propagation in AuSn die attach for high-temperature power modules 2017 18TH INTERNATIONAL CONFERENCE ON THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS (EUROSIME), 2017,