FIELD-ION MICROSCOPY OF HALOGENS ON TUNGSTEN

被引：21
|
作者：
FAULIAN, K [1 ]
BAUER, E [1 ]
机构：
[1] SFB 126, D-3392 CLAUSTHAL, FED REP GER
来源：
SURFACE SCIENCE | 1978年 / 70卷 / 01期
关键词：
D O I：
10.1016/0039-6028(78)90415-6
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：271 / 285
页数：15
相关论文
共 50 条
  • [21] SURFACE SHAPE CHANGES OF TUNGSTEN EMITTER STUDIED BY FIELD-ION MICROSCOPY
    NISHIGAKI, S
    NAKAMURA, S
    KURODA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 (01) : 79 - 83
  • [22] FIELD-ION MICROSCOPY DETERMINATION OF TWIN BOUNDARY ATOMIC CONFIGURATION IN TUNGSTEN
    MIKHAILOVSKII, IM
    FIZIKA TVERDOGO TELA, 1982, 24 (11): : 3210 - 3215
  • [23] COMBINED FIELD-ION MICROSCOPY AND TRANSMISSION ELECTRON-MICROSCOPY OF HEAVY-ION DAMAGE IN TUNGSTEN
    STILLER, K
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1990, 115 (1-3): : 205 - 215
  • [24] FIELD-ION MICROSCOPY OF SILICON
    MELMED, AJ
    STEIN, RJ
    SURFACE SCIENCE, 1975, 49 (02) : 645 - 648
  • [25] FIELD-ION MICROSCOPY OF COBALT
    NISHIKAW.O
    MULLER, EW
    JOURNAL OF APPLIED PHYSICS, 1967, 38 (08) : 3159 - &
  • [26] THORIUM FIELD-ION MICROSCOPY
    CARROLL, JJ
    KLEIN, R
    MELMED, AJ
    SURFACE SCIENCE, 1980, 93 (01) : L93 - L97
  • [27] FIELD-ION MICROSCOPY OF OSMIUM
    MELMED, AJ
    CARROLL, JJ
    JOURNAL OF THE LESS-COMMON METALS, 1973, 30 (02): : 199 - 204
  • [28] FIELD-ION MICROSCOPY OF GRAPHITE
    WILLIAMS, WS
    JOURNAL OF APPLIED PHYSICS, 1968, 39 (04) : 2131 - &
  • [29] FIELD-ION MICROSCOPY OF COBALT
    LEISCH, M
    KRAUTZ, E
    ZEITSCHRIFT FUR METALLKUNDE, 1974, 65 (06): : 437 - 441
  • [30] FIELD-ION MICROSCOPY OF BIOMOLECULES
    MACHLIN, ES
    FREILICH, A
    AGRAWAL, DC
    BURTON, JJ
    BRIANT, CL
    JOURNAL OF MICROSCOPY, 1975, 104 (JUL) : 127 - 168
12345