THEORY OF AVERAGED LOW-ENERGY ELECTRON-DIFFRACTION DATA

被引：32
|
作者：
PENDRY, JB
机构：
来源：
JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS | 1972年 / 5卷 / 18期
关键词：
D O I：
10.1088/0022-3719/5/18/006
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
收藏
页码：2567 / &
相关论文
共 50 条
  • [21] LOW-ENERGY ELECTRON-DIFFRACTION INTENSITY CALCULATIONS
    MCRAE, EG
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (03): : 308 - 308
  • [22] SURFACE CRYSTALLOGRAPHY BY LOW-ENERGY ELECTRON-DIFFRACTION
    WEBB, MB
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1972, 17 (03): : 231 - &
  • [23] MODULATION OF REFLECTIONS IN LOW-ENERGY ELECTRON-DIFFRACTION
    BABANSKAYA, LN
    VASILEV, MA
    GORODETSKII, SD
    CHEREPIN, VT
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1983, 26 (01) : 148 - 149
  • [24] LOW-ENERGY ELECTRON-DIFFRACTION ON VICINAL FACES
    LAYDEVANT, L
    DUPUY, JC
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1979, 4 (03): : A21 - A21
  • [25] AUTOMATIC ENERGY CONTROL IN LOW-ENERGY ELECTRON-DIFFRACTION
    BABANSKAYA, LN
    VASILEV, MA
    GORODETSKII, SD
    FILIPPOV, AS
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1984, 27 (02) : 418 - 420
  • [26] LOW-ENERGY ELECTRON-DIFFRACTION WITH MICROSCOPIC RESOLUTION
    KIRSCHNER, J
    ICHINOKAWA, T
    ISHIKAWA, Y
    KEMMOCHI, M
    IKEDA, N
    HOSOKAWA, Y
    SCANNING ELECTRON MICROSCOPY, 1986, 1986 : 331 - 336
  • [27] SYMMETRIZATION OF LOW-ENERGY ELECTRON-DIFFRACTION PATTERNS
    RUNDGREN, J
    SALWEN, A
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1974, 7 (23): : 4247 - 4258
  • [28] LOW-ENERGY ELECTRON-DIFFRACTION INSTRUMENTATION AND TECHNIQUES
    MORRISON, J
    JOURNAL OF APPLIED PHYSICS, 1966, 37 (10) : 3931 - &
  • [29] DYNAMICAL LOW-ENERGY ELECTRON-DIFFRACTION METHODS
    VANHOVE, MA
    PENDRY, JB
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1975, 8 (09): : 1362 - 1370
  • [30] LOW-ENERGY ELECTRON-DIFFRACTION AS A SURFACE PROBE
    CLARKE, LJ
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (03): : 779 - 802
12345