VARIATION OF YIELD WITH THICKNESS IN SIMS AND PDMS - MEASUREMENTS OF SECONDARY ION EMISSION FROM ORGANIZED MOLECULAR FILMS

被引：46
|
作者：
BOLBACH, G [1 ]
BEAVIS, R [1 ]
DELLANEGRA, S [1 ]
DEPRUN, C [1 ]
ENS, W [1 ]
LEBEYEC, Y [1 ]
MAIN, DE [1 ]
SCHUELER, B [1 ]
STANDING, KG [1 ]
机构：
[1] INST CURIE,PHYS & CHIM BIOMOLEC LAB,PHYS & CHIM SECT,F-75231 PARIS 05,FRANCE
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 30卷 / 01期
关键词：
D O I：
10.1016/0168-583X(88)90082-1
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：74 / 82
页数：9
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