Characterization of magnesium alloys through atomic force microscopy with Kelvin probe scanning (SKPFM)

被引：0
|
作者：
Coy Echeverria, Ana Emilse [1 ]
Abrante, Fernando Viejo [1 ]
Garcia Vergara, Sandra Judith [2 ]
Thompson, George E. [3 ]
Skeldon, Peter [3 ]
Hich, A. M. ' [1 ]
机构：
[1] Univ Complutense Madrid, Ciencia & Tecnol Mat, Madrid, Spain
[2] Univ Manchester, Ciencia & Ingn Corros, Manchester, Lancs, England
[3] Univ Manchester, Manchester, Lancs, England
来源：
REVISTA ITECKNE | 2011年 / 8卷 / 01期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：42 / 46
页数：5
相关论文
共 50 条
  • [41] Scanning capacitance force microscopy and Kelvin probe force microscopy of nanostructures embedded in SiO2
    Tallarida, G
    Spiga, S
    Fanciulli, M
    SCANNING PROBE MICROSCOPY: CHARACTERIZATION, NANOFABRICATION AND DEVICE APPLICATION OF FUNCTIONAL MATERIALS, 2005, 186 : 405 - +
  • [42] IMAGING HYDROGEN IN STAINLESS STEEL ALLOYS BY KELVIN PROBE FORCE MICROSCOPY
    McNamara, J. D.
    Morgan, M. J.
    Duncan, A. J.
    Korinko, P. S.
    PROCEEDINGS OF THE ASME PRESSURE VESSELS AND PIPING CONFERENCE, 2018, VOL 6B, 2019,
  • [43] Pulsed Force Kelvin Probe Force Microscopy
    Jakob, Devon S.
    Wang, Haomin
    Xu, Xiaoji G.
    ACS NANO, 2020, 14 (04) : 4839 - 4848
  • [44] Characterization of 475 °C Embrittlement of Duplex Stainless Steel Microstructure via Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy
    Ornek, C.
    Walton, J.
    Hashimoto, T.
    Ladwein, T. L.
    Lyon, S. B.
    Engelberg, D. L.
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2017, 164 (06) : C207 - C217
  • [45] Sub-Microscopic Phenomena of Metallic Corrosion Studied by a Combined Photoelectron Spectroscopy in Air (PESA) and Scanning Kelvin Probe Force Microscopy (SKPFM) Approach
    Pan, Tongyan
    Sun, Lu
    INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE, 2012, 7 (10): : 9325 - 9344
  • [46] The influence of microstructure on the corrosion behaviour of AZ91D studied by scanning Kelvin probe force microscopy and scanning Kelvin probe
    Jonsson, Martin
    Thierry, Dominique
    LeBozec, Nathalie
    CORROSION SCIENCE, 2006, 48 (05) : 1193 - 1208
  • [47] Quantitative calibration of the relationship between Volta potential measured by scanning Kelvin probe force microscope (SKPFM) and hydrogen concentration
    Ma, Zhaoxiang
    Xiong, Xilin
    Chen, Lin
    Su, Yanjing
    ELECTROCHIMICA ACTA, 2021, 366
  • [48] Electrical characterization of an operating Si pn-junction diode with scanning capacitance microscopy and Kelvin probe force microscopy
    Buh, GH
    Chung, HJ
    Yi, JH
    Yoon, IT
    Kuk, Y
    JOURNAL OF APPLIED PHYSICS, 2001, 90 (01) : 443 - 448
  • [49] Determining the effect of added zirconium on the bond character in TiFe alloys using scanning Kelvin probe force microscopy
    Han, Huijun
    Kim, Han-Jin
    Kim, Hayoung
    Sohn, So-Dam
    Shim, Jae-Hyeok
    Suh, Jin-Yoo
    Shin, Hyung-Joon
    APPLIED SURFACE SCIENCE, 2020, 517
  • [50] Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy
    Uruma, Takeshi
    Satoh, Nobuo
    Yamamoto, Hidekazu
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2017, 56 (08)
12345