Study of Melting Processes in Semicrystalline Polymers Using a Combination of Ultrafast Chip Calorimetry and Nanofocus Synchrotron X-Ray Diffraction

被引：1

作者：

Melnikov, A. P. ^{[1
]}

Rosenthal, M. ^{[2
]}

Burghammer, M. ^{[2
]}

Anokhin, D. V. ^{[3
]}

Ivanov, D. A. ^{[1
,4
]}

机构：

[1] Moscow MV Lomonosov State Univ, Fac Fundamental Phys & Chem Engn, Moscow 119991, Russia

[2] ESRF, 6 Rue Jules Horowitz, F-38043 Grenoble, France

[3] Russian Acad Sci, Inst Problems Chem Phys, Pr Semenova 1, Chernogolovka 142432, Moscow Oblast, Russia

[4] CNRS, UMR 7361, IS2M, 15 Jean Starcky, F-68057 Mulhouse, France

来源：

NANOTECHNOLOGIES IN RUSSIA | 2016年 / 11卷 / 5-6期

关键词：

D O I：

10.1134/S1995078016030113

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

This work is devoted to the development and application of a new experimental method that combines in situ ultrafast calorimetry on a chip with nanofocus synchrotron X-ray diffraction. In the present work, this method is used to study the melting mechanisms of samples of semicrystalline polymers with the mass of a few tens of nanograms. Such studies are relevant when working with materials that are characterized by complex phase behavior, for example, prone to transitions into metastable states or demonstrating fast processes of structural adjustment during thermal treatment.

引用

页码：305 / 311

页数：7

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