NOISE MEASUREMENTS IN ELECTRON-BEAM-EVAPORATED AMORPHOUS SILICON THIN-FILMS

被引：2
|
作者：
NEUDECK, GW
KRIEGEL, MH
机构：
来源：
THIN SOLID FILMS | 1978年 / 53卷 / 02期
关键词：
D O I：
10.1016/0040-6090(78)90037-8
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：209 / 215
页数：7
相关论文
共 50 条
  • [31] SURFACE AND BULK CONDUCTIVITY MEASUREMENTS ON AMORPHOUS-SILICON THIN-FILMS
    AIDA, MS
    BOUDJAADAR, S
    CHARI, A
    MAHDJOUBI, L
    THIN SOLID FILMS, 1992, 207 (1-2) : 1 - 3
  • [32] MICROSTRUCTURAL ANALYSIS OF EVAPORATED AND PYROLYTIC SILICON THIN-FILMS
    ANDERSON, RM
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (11) : 1540 - 1546
  • [33] Auto-correlation function analysis of structural transitions in electron-beam evaporated amorphous silicon thin films
    Cheng, SL
    Chi, KS
    Chen, LJ
    MICROSCOPY OF SEMICONDUCTING MATERIALS 2001, 2001, (169): : 57 - 60
  • [34] NOISE MEASUREMENTS IN YBACUO THIN-FILMS
    KOH, GH
    MOON, SH
    LEE, HJ
    KHIM, ZG
    PHYSICA C, 1991, 185 : 1813 - 1814
  • [35] CONDUCTIVITY AND NOISE IN THIN-FILMS OF NONHYDROGENATED AMORPHOUS-SILICON IN THE HOPPING REGIME
    DAMICO, A
    FORTUNATO, G
    VANVLIET, CM
    SOLID-STATE ELECTRONICS, 1985, 28 (08) : 837 - 844
  • [36] IR AND HIGH-ENERGY ELECTRON-DIFFRACTION ANALYSES OF ELECTRON-BEAM-EVAPORATED MGO FILMS
    ABOELFOTOH, MO
    PARK, KC
    PLISKIN, WA
    JOURNAL OF APPLIED PHYSICS, 1977, 48 (07) : 2910 - 2917
  • [37] Ultra-smooth e-beam evaporated amorphous silicon thin films - A viable alternative for PECVD amorphous silicon thin films for MEMS applications
    Joseph, Jose
    Singh, Shiv Govind
    Vanjari, Siva Rama Krishna
    MATERIALS LETTERS, 2017, 197 : 52 - 55
  • [38] Electron-Beam Crystallization of Thin Films of Amorphous Silicon Suboxide
    Baranov, E. A.
    Konstantinov, V. O.
    Shchukin, V. G.
    Zamchiy, A. O.
    Merkulova, I. E.
    Lunev, N. A.
    Volodin, V. A.
    TECHNICAL PHYSICS LETTERS, 2021, 47 (03) : 263 - 265
  • [39] Electron-Beam Crystallization of Thin Films of Amorphous Silicon Suboxide
    E. A. Baranov
    V. O. Konstantinov
    V. G. Shchukin
    A. O. Zamchiy
    I. E. Merkulova
    N. A. Lunev
    V. A. Volodin
    Technical Physics Letters, 2021, 47 : 263 - 265
  • [40] THE EFFECTS OF ANNEALING ON THE STRUCTURE AND COMPOSITION OF ELECTRON-BEAM-EVAPORATED TIN OXIDE-FILMS
    CHOUDHURY, NS
    GOEHNER, RP
    LEWIS, N
    GREEN, RW
    THIN SOLID FILMS, 1984, 122 (03) : 231 - 241
12345