首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
ROOM-TEMPERATURE SWITCHING AND NEGATIVE DIFFERENTIAL RESISTANCE IN THE HETEROSTRUCTURE HOT-ELECTRON DIODE
被引:25
|
作者
:
HIGMAN, TK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
HIGMAN, TK
[
1
]
MILLER, LM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
MILLER, LM
[
1
]
FAVARO, ME
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
FAVARO, ME
[
1
]
EMANUEL, MA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
EMANUEL, MA
[
1
]
HESS, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
HESS, K
[
1
]
COLEMAN, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
COLEMAN, JJ
[
1
]
机构
:
[1]
UNIV ILLINOIS,NSF ENGN RES CTR CPDS SEMICOND MICROELECTR,URBANA,IL 61801
来源
:
APPLIED PHYSICS LETTERS
|
1988年
/ 53卷
/ 17期
关键词
:
D O I
:
10.1063/1.99931
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1623 / 1625
页数:3
相关论文
共 50 条
[31]
HOT-ELECTRON TRANSPORT IN HETEROSTRUCTURE DEVICES
LURYI, S
论文数:
0
引用数:
0
h-index:
0
机构:
BELL COMMUN RES INC,MURRAY HILL,NJ 07974
BELL COMMUN RES INC,MURRAY HILL,NJ 07974
LURYI, S
KASTALSKY, A
论文数:
0
引用数:
0
h-index:
0
机构:
BELL COMMUN RES INC,MURRAY HILL,NJ 07974
BELL COMMUN RES INC,MURRAY HILL,NJ 07974
KASTALSKY, A
PHYSICA B & C,
1985,
134
(1-3):
: 453
-
465
[32]
THEORETICAL AND EXPERIMENTAL-ANALYSIS OF THE SWITCHING MECHANISM IN HETEROSTRUCTURE HOT-ELECTRON DIODES
HIGMAN, TK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR CMPD SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR CMPD SEMICOND MICROELECTR,URBANA,IL 61801
HIGMAN, TK
HIGMAN, JM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR CMPD SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR CMPD SEMICOND MICROELECTR,URBANA,IL 61801
HIGMAN, JM
EMANUEL, MA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR CMPD SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR CMPD SEMICOND MICROELECTR,URBANA,IL 61801
EMANUEL, MA
HESS, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR CMPD SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR CMPD SEMICOND MICROELECTR,URBANA,IL 61801
HESS, K
COLEMAN, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR CMPD SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR CMPD SEMICOND MICROELECTR,URBANA,IL 61801
COLEMAN, JJ
JOURNAL OF APPLIED PHYSICS,
1987,
62
(04)
: 1495
-
1499
[33]
Observation of negative differential resistance in GaAlAs single-barrier heterostructure at room temperature
Emelett, SJ
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Massachusetts, Dept Phys & Appl Phys, Lowell, MA 01851 USA
Univ Massachusetts, Dept Phys & Appl Phys, Lowell, MA 01851 USA
Emelett, SJ
Goodhue, WD
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Massachusetts, Dept Phys & Appl Phys, Lowell, MA 01851 USA
Goodhue, WD
Karakashian, AS
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Massachusetts, Dept Phys & Appl Phys, Lowell, MA 01851 USA
Karakashian, AS
Vaccaro, K
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Massachusetts, Dept Phys & Appl Phys, Lowell, MA 01851 USA
Vaccaro, K
JOURNAL OF APPLIED PHYSICS,
2004,
95
(05)
: 2930
-
2932
[34]
Observation of negative differential resistance in GaAlAs single-barrier heterostructure at room temperature
Emelett, S.J. (steve@solidstatescientific.com),
1600,
American Institute of Physics Inc.
(95):
[35]
ROOM-TEMPERATURE OPERATION OF A RESONANT-TUNNELING HOT-ELECTRON TRANSISTOR BASED INTEGRATED-CIRCUIT
MOISE, TS
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratories, Texas Instruments Incorporated, Dallas.
MOISE, TS
SEABAUGH, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratories, Texas Instruments Incorporated, Dallas.
SEABAUGH, AC
BEAM, EA
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratories, Texas Instruments Incorporated, Dallas.
BEAM, EA
RANDALL, JN
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratories, Texas Instruments Incorporated, Dallas.
RANDALL, JN
IEEE ELECTRON DEVICE LETTERS,
1993,
14
(09)
: 441
-
443
[36]
NEGATIVE DIFFERENTIAL RESISTANCE OF A DELTA-DOPING-INDUCED DOUBLE-BARRIER QUANTUM-WELL DIODE AT ROOM-TEMPERATURE
WANG, RL
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan
WANG, RL
SU, YK
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan
SU, YK
WANG, YH
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan
WANG, YH
YARN, KF
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan
YARN, KF
IEEE ELECTRON DEVICE LETTERS,
1990,
11
(10)
: 428
-
430
[37]
ELECTRON-TRANSPORT IN HETEROSTRUCTURE HOT-ELECTRON DIODES
ARNOLD, D
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
ARNOLD, D
HESS, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
HESS, K
IAFRATE, GJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
IAFRATE, GJ
APPLIED PHYSICS LETTERS,
1988,
53
(05)
: 373
-
375
[38]
ROOM-TEMPERATURE NEGATIVE DIFFERENTIAL RESISTANCE OF METAL (COSI2) INSULATOR (CAF2) RESONANT TUNNELING DIODE
SUEMASU, T
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Meguro-ku, Tokyo 152
SUEMASU, T
WATANABE, M
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Meguro-ku, Tokyo 152
WATANABE, M
ASADA, M
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Meguro-ku, Tokyo 152
ASADA, M
SUZUKI, N
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Meguro-ku, Tokyo 152
SUZUKI, N
ELECTRONICS LETTERS,
1992,
28
(15)
: 1432
-
1434
[39]
SiC/Si heterostructure negative-differential-resistance diode for high-temperature applications
Wu, KH
论文数:
0
引用数:
0
h-index:
0
机构:
Natl Cheng Kung Univ, VLSI Technol Lab, Dept Elect Engn, Tainan 70101, Taiwan
Natl Cheng Kung Univ, VLSI Technol Lab, Dept Elect Engn, Tainan 70101, Taiwan
Wu, KH
Fang, YK
论文数:
0
引用数:
0
h-index:
0
机构:
Natl Cheng Kung Univ, VLSI Technol Lab, Dept Elect Engn, Tainan 70101, Taiwan
Natl Cheng Kung Univ, VLSI Technol Lab, Dept Elect Engn, Tainan 70101, Taiwan
Fang, YK
Ho, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
Natl Cheng Kung Univ, VLSI Technol Lab, Dept Elect Engn, Tainan 70101, Taiwan
Natl Cheng Kung Univ, VLSI Technol Lab, Dept Elect Engn, Tainan 70101, Taiwan
Ho, JJ
Hsieh, WT
论文数:
0
引用数:
0
h-index:
0
机构:
Natl Cheng Kung Univ, VLSI Technol Lab, Dept Elect Engn, Tainan 70101, Taiwan
Natl Cheng Kung Univ, VLSI Technol Lab, Dept Elect Engn, Tainan 70101, Taiwan
Hsieh, WT
Chen, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
Natl Cheng Kung Univ, VLSI Technol Lab, Dept Elect Engn, Tainan 70101, Taiwan
Natl Cheng Kung Univ, VLSI Technol Lab, Dept Elect Engn, Tainan 70101, Taiwan
Chen, TJ
APPLIED PHYSICS LETTERS,
1998,
72
(23)
: 3017
-
3019
[40]
Room-temperature negative differential conductance in carbon nanotubes
Li, JQ
论文数:
0
引用数:
0
h-index:
0
机构:
Nanyang Technol Univ, Sch Elect & Elect Engn, Ctr Microelect, Singapore 639798, Singapore
Nanyang Technol Univ, Sch Elect & Elect Engn, Ctr Microelect, Singapore 639798, Singapore
Li, JQ
Zhang, Q
论文数:
0
引用数:
0
h-index:
0
机构:
Nanyang Technol Univ, Sch Elect & Elect Engn, Ctr Microelect, Singapore 639798, Singapore
Nanyang Technol Univ, Sch Elect & Elect Engn, Ctr Microelect, Singapore 639798, Singapore
Zhang, Q
CARBON,
2005,
43
(03)
: 667
-
670
←
1
2
3
4
5
→