DETERMINATION OF LOCAL THICKNESS AND COMPOSITION IN THE ANALYTICAL ELECTRON-MICROSCOPE

被引：0
|
作者：
HORITA, Z
ICHITANI, K
SANO, T
NEMOTO, M
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1988年 / 93期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Local thicknesses are determined using the Differential X-ray absorption (DXA) method (Morris et al. 1979) and compared with those measured by the convergent beam electron diffraction (CBED) method (Kelly et al. 1975) and the contamination spot separation (CSS) method (Lorimer et al. 1976, Knox 1976). The reliability and applicability of the DXA method are evaluated.
引用
收藏
页码：155 / 156
页数：2
相关论文
共 50 条
  • [21] ANALYTICAL ELECTRON-MICROSCOPE AND BIOLOGICAL SPECIMENS
    WATANABE, M
    SUZUKI, S
    MIKAJIRI, A
    KOIKE, H
    MATSUO, T
    JOURNAL OF ELECTRON MICROSCOPY, 1973, 22 (03): : 298 - 298
  • [22] ANALYTICAL ELECTRON-MICROSCOPE AND ITS APPLICATIONS
    NAMAE, T
    JOURNAL OF SUBMICROSCOPIC CYTOLOGY AND PATHOLOGY, 1974, 6 (01) : 139 - 139
  • [23] ANALYTICAL ELECTRON-MICROSCOPE - INSTRUMENTATION AND APPLICATIONS
    HARLING, DF
    MICROSCOPE, 1976, 24 (04): : 311 - 312
  • [24] ANALYTICAL COLOR FLUORESCENCE ELECTRON-MICROSCOPE
    KOIKE, H
    NAKANO, T
    FUJIMOTO, T
    OGAWA, K
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 591 - 592
  • [25] ANALYTICAL ELECTRON-MICROSCOPE AND ITS APPLICATIONS
    YOSHIDA, H
    SUMITOMO LIGHT METAL TECHNICAL REPORTS, 1982, 23 (3-4): : 111 - 119
  • [26] CONTAMINATION SPOTS IN ANALYTICAL ELECTRON-MICROSCOPE
    TOMITA, T
    HARADA, Y
    JOURNAL OF ELECTRON MICROSCOPY, 1978, 27 (04): : 362 - 363
  • [27] ATOMIC SPUTTERING IN THE ANALYTICAL ELECTRON-MICROSCOPE
    BRADLEY, CR
    ZALUZEC, NJ
    ULTRAMICROSCOPY, 1989, 28 (1-4) : 335 - 338
  • [28] ELECTRON-MICROSCOPE TRANSMISSION ELECTRON-MICROSCOPE AND SCANNING ELECTRON-MICROSCOPE
    WATANABE, T
    DENKI KAGAKU, 1986, 54 (08): : 667 - 670
  • [29] MEASURING LOCAL THICKNESS OF AMORPHIC AND CRYSTALLINE THIN-FILMS IN ELECTRON-MICROSCOPE
    ILIN, NP
    POZHGAI, I
    IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1977, 41 (11): : 2275 - 2284
  • [30] ELECTRON-MICROSCOPE MEASUREMENT OF THICKNESS OF PROTEIN CRYSTALS
    BARYNIN, VV
    SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1972, 16 (05): : 771 - &
12345