X-RAY-SCATTERING TOPOGRAPHY OF METALLIC MULTILAYER FILMS

被引：0
|
作者：
SHINOZAKI, T
HONDOH, T
GOTO, A
TAKAHASHI, A
TAKAMA, T
YAMAGUCHI, A
YAMAMOTO, R
机构：
[1] HOKKAIDO UNIV,INST LOW TEMP SCI,N19W8,SAPPORO,HOKKAIDO 060,JAPAN
[2] HOKKAIDO UNIV,DEPT APPL PHYS,SAPPORO,HOKKAIDO 060,JAPAN
[3] UNIV TOKYO,INST IND SCI,TOKYO 106,JAPAN
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1993年 / 126卷 / 1-3期
关键词：
D O I：
10.1016/0304-8853(93)90538-D
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
X-ray scattering topography has been applied to sputtered Co/Au multilayer films in order to clarify structural inhomogeneities along the film surface. The observed difference in the main peak intensities was larger than 20%, but with almost constant integrated intensities. A model for the film structures is discussed in terms of the distribution of crystal sizes and orientations.
引用
收藏
页码：34 / 37
页数：4
相关论文
共 50 条
  • [1] X-RAY-SCATTERING TOPOGRAPHY INVOLVING LOCAL SPECTROSCOPY
    CHIKAURA, Y
    SUZUKI, Y
    UDAGAWA, Y
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1993, 26 (12) : 2212 - 2218
  • [2] NONSPECULAR X-RAY-SCATTERING FROM MULTILAYER STRUCTURES
    KORTRIGHT, JB
    JOURNAL OF APPLIED PHYSICS, 1991, 70 (07) : 3620 - 3625
  • [3] X-RAY-SCATTERING BY BLACK FOAM FILMS
    PLATIKANOV, D
    GRAF, H
    WEISS, A
    COLLOID AND POLYMER SCIENCE, 1990, 268 (08) : 760 - 765
  • [4] X-RAY-SCATTERING AND TOPOGRAPHY STUDIES OF HG1-XMNXTE EPITAXIAL-FILMS
    HALLAM, TD
    HALDER, SK
    HUDSON, JM
    LI, CR
    FUNAKI, M
    LEWIS, JE
    BRINKMAN, AW
    TANNER, BK
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1993, 26 (4A) : A161 - A166
  • [5] X-RAY-SCATTERING FROM INTERFACIAL ROUGHNESS IN MULTILAYER STRUCTURES
    STEARNS, DG
    JOURNAL OF APPLIED PHYSICS, 1992, 71 (09) : 4286 - 4298
  • [6] X-RAY-SCATTERING RADIOGRAPHY AND ORIENTATION TOPOGRAPHY FOR CHARACTERIZATION OF SEMICONDUCTOR CRYSTALS
    CHIKAURA, Y
    KII, H
    SUZUKI, Y
    JOURNAL OF CRYSTAL GROWTH, 1990, 103 (1-4) : 344 - 349
  • [7] IMPROVED VALUES OF THE FORWARD X-RAY-SCATTERING FACTOR FOR METALLIC ALUMINUM
    BARKYOUMB, JH
    SMITH, DY
    ACTA CRYSTALLOGRAPHICA SECTION A, 1990, 46 : 630 - 632
  • [8] X-RAY-SCATTERING FACTORS OF METALLIC AND MOLECULAR-HYDROGEN CRYSTALS
    MONKHORST, HJ
    PACK, JD
    FREEMAN, DL
    SOLID STATE COMMUNICATIONS, 1979, 29 (10) : 735 - 737
  • [9] X-RAY-SCATTERING FROM ADSORBED XENON MONOLAYER FILMS
    BRADY, GW
    FEIN, DB
    STEELE, WA
    PHYSICAL REVIEW B, 1977, 15 (02) : 1120 - 1135
  • [10] X-RAY-SCATTERING BY A SUPERLATTICE
    APOSTOL, M
    SUPERLATTICES AND MICROSTRUCTURES, 1995, 17 (04) : 419 - 420
12345