MOLECULAR-BEAM EPITAXIAL-GROWTH OF HIGH-QUALITY INSB

被引:50
|
作者
MICHEL, E
SINGH, G
SLIVKEN, S
BESIKCI, C
BOVE, P
FERGUSON, I
RAZEGHI, M
机构
[1] Center for Quantum Devices, Northwestern University, Evanston
关键词
D O I
10.1063/1.112384
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this letter we report on the growth of high quality InSb by molecular beam epitaxy that has been optimized using reflection high energy electron diffraction. A 4.8 μm InSb layer grown on GaAs at a growth temperature of 395°C and a III/V incorporation ratio of 1:1.2 had an x-ray rocking curve of 158 arcsec and a Hall mobility of 92 300 cm2 V-1 at 77 K. This is the best material quality obtained for InSb nucleated directly onto GaAs reported to date. © 1994 American Institute of Physics.
引用
收藏
页码:3338 / 3340
页数:3
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