AUTOMATED OPTICAL INSPECTION AND TEST OF ACTIVE-MATRIX LIQUID-CRYSTAL ARRAYS

被引:0
|
作者
CHINNOCK, C
机构
[1] Technical Marketing Services, Norwalk, United States
关键词
Cameras - Charge coupled devices - Defects - Electron device manufacture - Electronics packaging - Glass - Image processing - Inspection - Liquid crystals - Masks - Optical testing - Thin film transistors;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Active matrix liquid-crystal displays (AMLCDs) are enjoying rapid market growth. But yields remain a major concern, and few AMLCD manufacturers are profitably producing these displays. One inspection technique, automated optical inspection (AOI), uses image processing methods to find defects in various patterned layers. AOI was originally created to find defects in photomasks, but it has been adopted for production of semiconductor wafers, printed circuit boards, multichip modules, and most recently, flat panel displays.
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页码:75 / &
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