TEM CHARACTERIZATION OF GRAIN-BOUNDARIES

被引:0
|
作者
GRONSKY, R
THOMAS, G
机构
[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DIV MAT & MOLEC RES,BERKELEY,CA 94720
[2] UNIV CALIF BERKELEY,BERKELEY,CA 94720
来源
JOURNAL OF METALS | 1979年 / 31卷 / 08期
关键词
D O I
暂无
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
引用
收藏
页码:F18 / F18
页数:1
相关论文
共 50 条
  • [42] PLASMA-ETCHING OF TEM SAMPLES FOR OBSERVING GRAIN-BOUNDARIES IN SILICON-NITRIDE
    SUEMATSU, H
    BANDO, Y
    MITOMO, M
    JOURNAL OF ELECTRON MICROSCOPY, 1995, 44 (03): : 159 - 164
  • [43] TEM OBSERVATIONS OF THE GRAIN-BOUNDARIES IN A SEMICONDUCTING BARIUM-TITANATE THICK-FILM
    KOUMOTO, K
    TAGAWA, H
    NAKANO, T
    TAKEDA, S
    YANAGIDA, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1984, 23 (05): : L305 - L307
  • [44] SELECTIVE SEGREGATION AT GRAIN-BOUNDARIES
    AUST, KT
    CANADIAN METALLURGICAL QUARTERLY, 1974, 13 (01) : 133 - 143
  • [45] ENERGY OF GRAIN-BOUNDARIES IN SEMICONDUCTORS
    MOLLER, HJ
    JOURNAL DE PHYSIQUE, 1982, 43 (NC1): : 33 - 43
  • [46] TILT GRAIN-BOUNDARIES IN NIO
    MERKLE, KL
    REDDY, JF
    WILEY, CL
    ULTRAMICROSCOPY, 1985, 18 (1-4) : 281 - 284
  • [47] DEFECT STRUCTURES IN GRAIN-BOUNDARIES
    HIRTH, JP
    ACTA METALLURGICA, 1974, 22 (08): : 1023 - 1031
  • [48] GRAIN-BOUNDARIES IN POLYCRYSTALLINE SILICON
    SEAGER, CH
    ANNUAL REVIEW OF MATERIALS SCIENCE, 1985, 15 : 271 - 302
  • [49] THE STRUCTURE OF GRAIN-BOUNDARIES IN METALS
    FISCHMEISTER, HF
    ZEITSCHRIFT FUR METALLKUNDE, 1986, 77 (12): : 771 - 780
  • [50] ANALYSIS OF GRAIN-BOUNDARIES BY HREM
    ELGAT, Z
    CARTER, CB
    ULTRAMICROSCOPY, 1985, 18 (1-4) : 313 - 321