共 50 条
- [1] CHARACTERIZATION OF GRAIN-BOUNDARIES IN SILICON BY TEM AND EBIC JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1983, 8 (03): : 233 - &
- [2] A STUDY OF JUNCTIONS OF GRAIN-BOUNDARIES BY TEM SCRIPTA METALLURGICA ET MATERIALIA, 1990, 24 (04): : 709 - 712
- [4] THE CHARACTERIZATION OF GRAIN-BOUNDARIES SCRIPTA METALLURGICA ET MATERIALIA, 1992, 27 (11): : 1509 - 1514
- [5] TEM INVESTIGATION OF GRAIN-BOUNDARIES IN POLYCRYSTALLINE SILICON JOURNAL DE PHYSIQUE, 1982, 43 (NC1): : 21 - 25
- [6] GRAIN-BOUNDARIES ANALYSIS IN POLYCRYSTALLINE SILICON BY TEM JOURNAL DE PHYSIQUE, 1982, 43 (NC1): : 9 - 14
- [7] TEM OBSERVATIONS ON GRAIN-BOUNDARIES IN SINTERED SILICON PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1979, 40 (05): : 589 - 610
- [8] EXAMINATION OF GRAIN-BOUNDARIES OF MNZN FERRITES BY AES AND TEM AMERICAN CERAMIC SOCIETY BULLETIN, 1979, 58 (03): : 372 - 372