SELECTIVITY EFFECT OF CESIUM ON CLAY SIZE WEATHERED MICA - TRANSMISSION ELECTRON-MICROSCOPY STUDIES

被引：1
|
作者：
GAL, M
RICH, CI
机构：
来源：
CLAYS AND CLAY MINERALS | 1972年 / 20卷 / 03期
关键词：
D O I：
10.1346/CCMN.1972.0200310
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：175 / &
相关论文
共 50 条
  • [31] TRENDS IN TRANSMISSION ELECTRON-MICROSCOPY
    DELONG, A
    DRAHOS, V
    CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1975, 25 (01): : 14 - 27
  • [32] HOLOGRAPHY AND TRANSMISSION ELECTRON-MICROSCOPY
    MATTEUCCI, G
    POZZI, G
    TONOMURA, A
    JOURNAL DE PHYSIQUE IV, 1993, 3 (C7): : 2063 - 2072
  • [33] FUNDAMENTALS OF TRANSMISSION ELECTRON-MICROSCOPY
    不详
    MEMOIRES SCIENTIFIQUES DE LA REVUE DE METALLURGIE, 1965, 62 (03): : 255 - &
  • [34] TRANSMISSION ELECTRON-MICROSCOPY AND SCANNING ELECTRON-MICROSCOPY STUDIES OF HYDROGEN EFFECTS IN COPPER AND CU-AL ALLOYS
    KIM, JJ
    BYRNE, JG
    MATERIALS SCIENCE AND ENGINEERING, 1985, 76 (1-2): : 181 - 185
  • [35] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY APPLIED TO CLAY-MINERALS
    GUTHRIE, GD
    VEBLEN, DR
    ACS SYMPOSIUM SERIES, 1989, 415 : 75 - 93
  • [36] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY APPLIED TO CLAY-MINERALS
    GUTHRIE, GD
    VEBLEN, DR
    SPECTROSCOPIC CHARACTERIZATION OF MINERALS AND THEIR SURFACES, 1989, 415 : 75 - 93
  • [37] STRUCTURAL STUDIES OF METALLIC MULTILAYERS USING TRANSMISSION ELECTRON-MICROSCOPY
    CHEVALIER, JP
    METALLIC MULTILAYERS, 1989, 59 : 141 - 159
  • [38] STUDIES OF COPPER HYDRIDE .2. TRANSMISSION ELECTRON-MICROSCOPY
    HERLEY, PJ
    FITZSIMONS, NP
    JONES, W
    JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS, 1995, 91 (04): : 719 - 724
  • [39] TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF KR+-IMPLANTED SILICON
    MORAWIEC, J
    ACTA PHYSICA POLONICA A, 1994, 85 (05) : 819 - 824
  • [40] INSITU AND EXSITU TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF HETEROGENEOUS CATALYSTS
    BILLYARD, PD
    GORINGE, MJ
    PARKINSON, GM
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1990, (98): : 235 - 238
12345