ON THE PROBLEM OF MEASURING THERMOELECTRIC PROPERTIES OF SEMICONDUCTORS

被引：0
|
作者：
KAGANOV, MA
LISKER, IS
MUSHKIN, IG
机构：
来源：
SOVIET PHYSICS-SOLID STATE | 1959年 / 1卷 / 06期
关键词：
D O I：
暂无
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
下载
收藏
页码：905 / 907
页数：3
相关论文
共 50 条
  • [31] Investigation of thermoelectric properties of chalcogenide semiconductors from first principles
    Sevik, C.
    Cagin, T.
    JOURNAL OF APPLIED PHYSICS, 2011, 109 (12)
  • [32] Thermoelectric properties of Ce-based Kondo semimetals and semiconductors
    Takabatake, T
    Sasakawa, T
    Kitagawa, J
    Suemitsu, T
    Echizen, Y
    Umeo, K
    Sera, M
    Bando, Y
    PHYSICA B-CONDENSED MATTER, 2003, 328 (1-2) : 53 - 57
  • [33] Thermoelectric properties of β-Fe1-xCoxSi2 semiconductors
    Tani, J
    Kido, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (5A): : 3236 - 3239
  • [34] Thermoelectric properties of boron-rich icosahedral cluster semiconductors
    Nakayama, Takahiro
    Kimura, Kaoru
    Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals, 1999, 63 (11): : 1400 - 1406
  • [35] Effect of electrons and phonons temperature mismatch on thermoelectric properties of semiconductors
    Bulat, LP
    PROCEEDINGS ICT'97 - XVI INTERNATIONAL CONFERENCE ON THERMOELECTRICS, 1997, : 567 - 570
  • [36] Thermoelectric properties of boron-rich icosahedral cluster semiconductors
    Nakayama, T
    Kimura, K
    JOURNAL OF THE JAPAN INSTITUTE OF METALS, 1999, 63 (11) : 1400 - 1406
  • [37] α-In σ plots in thermoelectric semiconductors
    Bhandari, CM
    INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1999, 37 (05) : 434 - 435
  • [38] APPARATUS FOR MEASURING THERMOELECTRIC POWER AND ELECTRICAL CONDUCTIVITY OF SEMICONDUCTORS UP TO 1000 DEGREES C
    ASTAKHOV, OP
    LOBANKOV, VV
    SURKOV, BM
    MEASUREMENT TECHNIQUES, 1972, 15 (06) : 889 - 890
  • [39] CRYOSTATS FOR MEASURING ELECTRICAL THERMOELECTRIC GALVANOMAGNETIC AND THERMOMAGNETIC PROPERTIES
    DAVIDENK.NI
    FAKIDOV, IG
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1967, (05): : 1239 - &
  • [40] New measuring techniques for the investigation of thermoelectric properties of nanowires
    Schmitt, M. C.
    Reith, H.
    Huzel, D.
    Voelklein, F.
    9TH EUROPEAN CONFERENCE ON THERMOELECTRICS (ECT2011), 2012, 1449 : 385 - 388
12345