ELECTRON ESCAPE DEPTH IN SILICON

被引：153
|
作者：
KLASSON, M [1 ]
BERNDTSSON, A [1 ]
HEDMAN, J [1 ]
NILSSON, R [1 ]
NYHOLM, R [1 ]
NORDLING, C [1 ]
机构：
[1] UNIV UPPSALA, INST PHYS, BOX 530, S-75121 UPPSALA, SWEDEN
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1974年 / 3卷 / 06期
关键词：
D O I：
10.1016/0368-2048(74)80029-0
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：427 / 434
页数：8
相关论文
共 50 条
  • [1] Determination of electron escape depth in ultrathin silicon oxide
    Nohira, H
    Okamoto, H
    Azuma, K
    Nakata, Y
    Ikenaga, E
    Kobayashi, K
    Takata, Y
    Shin, S
    Hattori, T
    [J]. APPLIED PHYSICS LETTERS, 2005, 86 (08) : 1 - 3
  • [2] Experimental estimate of electron escape depth in Fe
    Akgul, G.
    Aksoy, F.
    Ufuktepe, Y.
    Luning, J.
    [J]. SOLID STATE COMMUNICATIONS, 2009, 149 (9-10) : 384 - 386
  • [3] Determination of the Electron Escape Depth for NEXAFS Spectroscopy
    Sohn, K. E.
    Dimitriou, M. D.
    Genzer, J.
    Fischer, D. A.
    Hawker, C. J.
    Kramer, E. J.
    [J]. LANGMUIR, 2009, 25 (11) : 6341 - 6348
  • [4] DETERMINATION OF ELECTRON ESCAPE DEPTH IN GOLD BY MEANS OF ESCA
    BAER, Y
    HEDEN, PF
    HEDMAN, J
    KLASSON, M
    NORDLING, C
    [J]. SOLID STATE COMMUNICATIONS, 1970, 8 (18) : 1479 - &
  • [5] ENERGY-DEPENDENCE OF ELECTRON-ESCAPE DEPTH IN BARIUM
    JACOBI, K
    ASTALDI, C
    [J]. SURFACE SCIENCE, 1988, 206 (1-2) : L829 - L832
  • [6] ESCAPE DEPTH OF SECONDARY ELECTRONS FROM ELECTRON-IRRADIATED POLYMERS
    HESSEL, R
    GROSS, B
    [J]. IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1992, 27 (04): : 831 - 834
  • [7] Optical potential and escape depth for electron scattering at very low energies
    Solterbeck, C
    Tiedje, O
    Strasser, T
    Brodersen, S
    Bödicker, A
    Schattke, W
    Bartos, I
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1999, 101 : 473 - 478
  • [8] Information depth and the mean escape depth in Auger electron spectroscopy and X-ray photoelectron spectroscopy
    Jablonski, A
    Powell, CJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2003, 21 (01): : 274 - 283
  • [9] Photoelectron escape depth
    Zemek, J
    Hucek, S
    Jablonski, A
    Tilinin, IS
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1995, 76 : 443 - 447
  • [10] ESCAPE DEPTH OF PHOTOELECTRONS
    JABLONSKI, A
    [J]. SURFACE AND INTERFACE ANALYSIS, 1994, 21 (11) : 758 - 763
12345