DETECTION OF MINORITY-CARRIER TRAPS IN SEMICONDUCTORS

被引：6

|

作者：

LEMKE, H

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1980年 / 62卷 / 02期

关键词：

D O I：

10.1002/pssa.2210620223

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：539 / 545

页数：7

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