CHAOTIC CURRENT OSCILLATIONS IN THE GUNN-EFFECT DEVICE UNDER THE DC AND THE RF BIAS VOLTAGES

被引:12
|
作者
OSHIO, K
YAHATA, H
机构
[1] Department of Materials Science, Faculty of Science, Hiroshima University, Saijo Campus
关键词
GUNN EFFECT; N-GAAS; HIGH-FIELD DOMAIN; COMPUTER SIMULATION; CHAOS;
D O I
10.1143/JPSJ.62.3639
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A one-dimensional model system of the Gunn-effect device is considered. It consists of an n+-n-n+ GaAs sandwich structure where the high-n+ contact layers on both ends are linearly graded to the uniformly distributed low-n bulk region and a half-wave sinusoidal doping notch is incorporated near the cathode. Using the finite differece method, spatio-temporal evolution of the system subject to the dc and the rf-alternating fields is computed with the amplitudes and the frequency being taken as the control parameters. Current oscillations associated with the cyclic traveling high-electric-field domain are shown to materialize over a range of the control parameters. In particular, the current oscillations become chaotic at specially chosen values of these bias parameters.
引用
收藏
页码:3639 / 3650
页数:12
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