SELF-NULLING EDDY-CURRENT PROBE FOR SURFACE AND SUBSURFACE FLAW DETECTION

被引：0
|
作者：
WINCHESKI, B
FULTON, JP
NATH, S
NAMKUNG, M
SIMPSON, JW
机构：
[1] NASA,LANGLEY RES CTR,HAMPTON,VA 23681
[2] LOCKHEED ENGN & CO,HAMPTON,VA 23666
来源：
MATERIALS EVALUATION | 1994年 / 52卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：22 / 27
页数：6
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