SURFACE-TOPOGRAPHY IN SCANNING TUNNELING MICROSCOPY - A FREE-ELECTRON MODEL

被引：29
|
作者：
SACKS, W [1 ]
GAUTHIER, S [1 ]
ROUSSET, S [1 ]
KLEIN, J [1 ]
ESRICK, MA [1 ]
机构：
[1] LOYOLA COLL,DEPT PHYS,BALTIMORE,MD 21210
来源：
PHYSICAL REVIEW B | 1987年 / 36卷 / 02期
关键词：
D O I：
10.1103/PhysRevB.36.961
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：961 / 967
页数：7
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