SCANNING TUNNELING MICROSCOPY STUDY OF THE DEGREE OF DIMER ASYMMETRY ON THE SI(001)-(2X1) SURFACE

被引:18
|
作者
WIESENDANGER, R [1 ]
BURGLER, D [1 ]
TARRACH, G [1 ]
GUNTHERODT, HJ [1 ]
SHVETS, IV [1 ]
COEY, JMD [1 ]
机构
[1] UNIV DUBLIN,DEPT PHYS,DUBLIN 2,IRELAND
关键词
D O I
10.1016/0039-6028(92)90102-C
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The degree of dimer asymmetry on the Si(001)-(2 x 1) surface as seen in high resolution scanning tunneling microscopy (STM) images has been studied in detail. It is found that the degree of dimer asymmetry can change drastically from one terrace to another. The degree of dimer asymmetry has also been studied as a function of tip material using non-magnetic W and ferromagnetic Fe tips.
引用
收藏
页码:93 / 98
页数:6
相关论文
共 50 条
  • [21] SI(001) DIMER STRUCTURE OBSERVED WITH SCANNING TUNNELING MICROSCOPY
    TROMP, RM
    HAMERS, RJ
    DEMUTH, JE
    PHYSICAL REVIEW LETTERS, 1985, 55 (12) : 1303 - 1306
  • [22] Scanning tunneling microscopic studies of laser-induced modifications of Si(001)-(2x1) surface
    Yasui, Kosuke
    Kanasaki, Jun'ichi
    JOURNAL OF APPLIED PHYSICS, 2011, 110 (10)
  • [23] PREDICTION OF THE EFFECT OF THE SAMPLE BIASING IN SCANNING TUNNELING MICROSCOPY AND OF SURFACE-DEFECTS ON THE OBSERVED CHARACTER OF THE DIMERS IN THE SI(001)-(2X1) SURFACE
    BADZIAG, P
    VERWOERD, WS
    VANHOVE, MA
    PHYSICAL REVIEW B, 1991, 43 (03): : 2058 - 2062
  • [24] REAL-TIME OBSERVATIONS OF VACANCY DIFFUSION ON SI(001)-(2X1) BY SCANNING-TUNNELING-MICROSCOPY
    KITAMURA, N
    LAGALLY, MG
    WEBB, MB
    PHYSICAL REVIEW LETTERS, 1993, 71 (13) : 2082 - 2085
  • [25] SURFACE DIMER IMAGING USING KIKUCHI ELECTRON HOLOGRAPHY - A STUDY ON SI(001)(2X1) SURFACE
    HONG, IH
    JENG, PR
    SHYU, SC
    CHOU, YC
    WEI, CM
    SURFACE SCIENCE, 1994, 312 (1-2) : L743 - L747
  • [26] SCANNING-TUNNELING-MICROSCOPY STUDY OF OXIDE NUCLEATION AND OXIDATION-INDUCED ROUGHENING AT ELEVATED-TEMPERATURES ON THE SI(001)-(2X1) SURFACE
    SEIPLE, JV
    PELZ, JP
    PHYSICAL REVIEW LETTERS, 1994, 73 (07) : 999 - 1002
  • [27] Split-off dimer defects on the Si(001)2x1 surface
    Schofield, SR
    Curson, NJ
    O'Brien, JL
    Simmons, MY
    Clark, RG
    Marks, NA
    Wilson, HF
    Brown, GW
    Hawley, ME
    PHYSICAL REVIEW B, 2004, 69 (08)
  • [28] SCANNING-TUNNELING-MICROSCOPY STUDIES OF AG ON SI(100)-(2X1)
    SAMSAVAR, A
    HIRSCHORN, ES
    LEIBSLE, FM
    CHIANG, TC
    PHYSICAL REVIEW LETTERS, 1989, 63 (26) : 2830 - 2833
  • [29] Oxygen atoms on Si(100)-(2x1): Imaging with scanning tunneling microscopy
    Trenhaile, B. R.
    Agrawal, Abhishek
    Weaver, J. H.
    APPLIED PHYSICS LETTERS, 2006, 89 (15)
  • [30] ARSINE ABSORPTION ON SI(100) 2X1 - A PHOTOEMISSION AND SCANNING-TUNNELING-MICROSCOPY STUDY
    KIPP, L
    BRINGANS, RD
    BIEGELSEN, DK
    SWARTZ, LE
    HICKS, RF
    PHYSICAL REVIEW B, 1994, 50 (08): : 5448 - 5455