CIRCULAR STACKING-FAULTS IN SILICON

被引：23
|
作者：
TICE, WK
HUANG, TC
机构：
[1] IBM CORP,SYST PROD DIV,ESSEX JUNCTION,UT 05452
[2] IBM CORP,RES DIV,SAN JOSE,CA 95193
来源：
APPLIED PHYSICS LETTERS | 1974年 / 24卷 / 04期
关键词：
D O I：
10.1063/1.1655133
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：157 / 158
页数：2
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