Optical and structural properties of strained InAlAs/InAsxP1-x multi-quantum wells grown by solid source molecular beam epitaxy

被引:5
|
作者
Kim, TH [1 ]
Brown, AS [1 ]
Metzger, RA [1 ]
机构
[1] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
关键词
D O I
10.1063/1.371101
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the optical and structural properties of strained InAlAs/InAsxP1-x heterostructures grown by solid source molecular beam epitaxy. The incorporation of As-4 into strained InAsP has been studied using x-ray diffraction and photoluminscence measurements. We find that the incorporation of As decreases as x in the InAsxP1-x increases due, presumably, to increased strain. In addition, we have examined the effect of interface growth conditions and barrier material on the quantum well properties. The 4.2 K photoluminescence spectra of InAlAs/InAsP multi-quantum wells grown with different As and P flux switching conditions at the interfaces were compared with that of higher quality InP/InAsP multi-quantum wells. This comparison shows that the interface quality of InAlAs/InAsP multi-quantum wells is highly dependent on the switching conditions at the interfaces, especially the exposure time of InAsP surface to an As-4 overpressure. This sensitivity is due to the As-P exchange reaction at the interfaces of InAlAs/InAsP. (C) 1999 American Institute of Physics. [S0021-8979(99)08717-4].
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页码:2622 / 2627
页数:6
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