NEW TECHNIQUE FOR SHORT TIME MEASUREMENT

被引:0
|
作者
不详
机构
来源
BELL LABORATORIES RECORD | 1970年 / 48卷 / 06期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:190 / &
相关论文
共 50 条
  • [1] NEW TECHNIQUE FOR MEASUREMENT OF RELAXATION TIME
    MEHTA, RV
    DAVE, MJ
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (07): : 1074 - &
  • [2] NEW TECHNIQUE FOR MEASUREMENT OF SINOATRIAL CONDUCTION TIME
    NARULA, OS
    LINHART, JW
    VASQUEZ, M
    CLINICAL RESEARCH, 1977, 25 (03): : A241 - A241
  • [3] NEW TECHNIQUE FOR MEASUREMENT OF SINOATRIAL CONDUCTION TIME (SACT)
    NARULA, O
    VASQUEZ, M
    SHANTA, N
    LINHART, J
    CIRCULATION, 1977, 56 (04) : 199 - 199
  • [4] MEASUREMENT OF OROCECAL TRANSIT-TIME BY A NEW FERROMAGNETIC TECHNIQUE
    OLIVEIRA, RB
    MIRANDA, JR
    BAFFA, O
    MATSUDA, NM
    TRONCON, LEA
    GUT, 1991, 32 (10) : A1215 - A1215
  • [5] TECHNIQUE FOR MEASUREMENT OF SHORT CARRIER LIFETIMES
    CHOO, SC
    HEASELL, EL
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1962, 33 (12): : 1331 - &
  • [6] SHORT (SHOrt rendezvous technique): A new ERCP rendezvous technique
    Ayala, Juan C.
    Labbe, Ricardo
    Vera, Juan E.
    GASTROINTESTINAL ENDOSCOPY, 2008, 67 (05) : AB159 - AB160
  • [7] THE MEASUREMENT OF SHORT TIME INTERVALS
    ALVAREZ, LW
    PHYSICAL REVIEW, 1947, 72 (08): : 741 - 741
  • [8] Time-domain Measurement Technique to Analyze Cyclic Short-Time Interference in Power Supply Networks
    Setiawan, Iwan
    Keyer, Cees
    Azpurua, Marco
    Silva, Ferran
    Leferink, Frank
    2016 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC), 2016, : 279 - 282
  • [9] PROACTIVE INTERFERENCE IN SHORT-TERM RETENTION AND MEASUREMENT OF DEGREE OF LEARNING - NEW TECHNIQUE
    NOWACZYK, RH
    SHAUGHNE.JJ
    ZIMMERMA.J
    JOURNAL OF EXPERIMENTAL PSYCHOLOGY, 1974, 103 (01): : 45 - 53
  • [10] NEW CORRELATION TECHNIQUE FOR MEASURING SHORT ELECTRICAL PULSES WITH PICOSECOND TIME RESOLUTION
    PAULUS, P
    JAGER, D
    PFEIFFER, T
    KUHL, J
    APPLIED PHYSICS LETTERS, 1986, 48 (22) : 1550 - 1551