共 50 条
- [2] The Scaling of Electromigration Lifetimes 2012 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2012,
- [3] Investigation of Electromigration in Copper Interconnection of ULSI 2008 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING, VOLS 1 AND 2, 2008, : 1059 - 1062
- [7] Theory of electromigration SOLID STATE PHYSICS, VOL 51: ADVANCES IN RESEARCH AND APPLICATIONS, 1998, 51 : 159 - 231