共 50 条
- [31] LIMITS OF QUANTITATIVE MICROANALYSIS USING SECONDARY ION MASS-SPECTROMETRY SCANNING ELECTRON MICROSCOPY, 1985, : 553 - 561
- [34] Revisiting Microanalysis using Secondary Ion Emission 60 years later JOURNAL OF MASS SPECTROMETRY, 2021, 56 (12):
- [35] NUCLEAR MICROANALYSIS USING MEV CARBON ION BACKSCATTERING - USEFULNESS AND APPLICATIONS JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1973, 16 (02): : 587 - 603
- [37] URANIUM CONCENTRATION BY CRUSTACEA - A STRUCTURAL, ULTRASTRUCTURAL AND MICROANALYTICAL STUDY BY SECONDARY ION EMISSION AND ELECTRON-PROBE X-RAY-MICROANALYSIS COMPTES RENDUS DE L ACADEMIE DES SCIENCES SERIE III-SCIENCES DE LA VIE-LIFE SCIENCES, 1982, 294 (18): : 919 - 924
- [38] CONCENTRATION PROFILES THROUGH THIN OXIDE SCALES BY ION-PROBE MICROANALYSIS METALLURGICAL TRANSACTIONS, 1973, 4 (02): : 411 - 417
- [39] Nuclear models and microanalysis NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 130 (1-4): : 224 - 229
- [40] STUDY OF SURFACE CONTAMINATION (O,C,N,F) OF METALS BY MEANS OF NUCLEAR MICROANALYSIS REVUE DE PHYSIQUE APPLIQUEE, 1975, 10 (02): : 87 - 94