NUCLEAR CONCENTRATION OF METALS IN SECONDARY ION MICROANALYSIS

被引:0
|
作者
TRUCHET, M [1 ]
机构
[1] UNIV PARIS 06, CNRS, HISTOPHYSIOL FONDAMENTALE & APPL LAB, EQUIPE RECH 570, F-75230 PARIS 05, FRANCE
关键词
D O I
暂无
中图分类号
Q2 [细胞生物学];
学科分类号
071009 ; 090102 ;
摘要
引用
收藏
页码:591 / 591
页数:1
相关论文
共 50 条
  • [31] LIMITS OF QUANTITATIVE MICROANALYSIS USING SECONDARY ION MASS-SPECTROMETRY
    WILLIAMS, P
    SCANNING ELECTRON MICROSCOPY, 1985, : 553 - 561
  • [32] SECONDARY ION EMISSION MICROANALYSIS - APPLICATIONS TO THE STUDY OF HUMAN-SKIN
    GUILLAUME, JC
    PROST, C
    DUBERTRET, L
    TOURAINE, R
    ARCHIVES OF DERMATOLOGICAL RESEARCH, 1981, 270 (01) : 37 - 47
  • [33] SECONDARY ION MICROANALYSIS IN THE STUDY OF COBALT-INDUCED EPILEPSY IN THE RAT
    TROTTIER, S
    TRUCHET, M
    LAROUDIE, C
    EXPERIMENTAL NEUROLOGY, 1982, 76 (02) : 231 - 245
  • [34] Revisiting Microanalysis using Secondary Ion Emission 60 years later
    Slodzian, Georges
    JOURNAL OF MASS SPECTROMETRY, 2021, 56 (12):
  • [35] NUCLEAR MICROANALYSIS USING MEV CARBON ION BACKSCATTERING - USEFULNESS AND APPLICATIONS
    ABEL, F
    AMSEL, G
    BRUNEAUX, M
    COHEN, C
    MAUREL, B
    RIGO, S
    ROUSSEL, J
    JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1973, 16 (02): : 587 - 603
  • [36] ION MICROANALYSIS
    SLODZIAN, G
    REVUE DE PHYSIQUE APPLIQUEE, 1968, 3 (04): : 360 - &
  • [37] URANIUM CONCENTRATION BY CRUSTACEA - A STRUCTURAL, ULTRASTRUCTURAL AND MICROANALYTICAL STUDY BY SECONDARY ION EMISSION AND ELECTRON-PROBE X-RAY-MICROANALYSIS
    CHASSARDBOUCHAUD, C
    COMPTES RENDUS DE L ACADEMIE DES SCIENCES SERIE III-SCIENCES DE LA VIE-LIFE SCIENCES, 1982, 294 (18): : 919 - 924
  • [38] CONCENTRATION PROFILES THROUGH THIN OXIDE SCALES BY ION-PROBE MICROANALYSIS
    WRIGHT, IG
    SELTZER, MS
    METALLURGICAL TRANSACTIONS, 1973, 4 (02): : 411 - 417
  • [39] Nuclear models and microanalysis
    Berthier, B
    Berthoumieux, E
    Gallien, JP
    Moreau, C
    Raoux, AC
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 130 (1-4): : 224 - 229
  • [40] STUDY OF SURFACE CONTAMINATION (O,C,N,F) OF METALS BY MEANS OF NUCLEAR MICROANALYSIS
    BERANGER, G
    DAVID, D
    GARCIA, EA
    LUCAS, X
    REVUE DE PHYSIQUE APPLIQUEE, 1975, 10 (02): : 87 - 94