THE MEASURING OF 1-F NOISE OF THICK AND THIN-FILM RESISTORS

被引：14
|
作者：
DEMOLDER, S
VANDENDRIESSCHE, M
VANCALSTER, A
机构：
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1980年 / 13卷 / 12期
关键词：
D O I：
10.1088/0022-3735/13/12/024
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1323 / 1327
页数：5
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