SHADOW-CONE ENHANCED DESORPTION WITH ANGLE-RESOLVED SECONDARY ION MASS-SPECTROMETRY DETECTION

被引：11
|
作者：
CHANG, CC
MALAFSKY, G
WINOGRAD, N
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期
关键词：
D O I：
10.1116/1.574306
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：981 / 984
页数：4
相关论文
共 50 条
  • [41] TARGET ENVIRONMENT AND ENERGY DEPOSITION IN PARTICLE INDUCED DESORPTION - CF-252 PLASMA DESORPTION MASS-SPECTROMETRY, SECONDARY ION MASS-SPECTROMETRY AND FAST-ATOM-BOMBARDMENT MASS-SPECTROMETRY
    BLAIS, JC
    VIARI, A
    COLE, RB
    TABET, JC
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1990, 98 (02): : 155 - 166
  • [42] QUANTITATIVE SECONDARY ION MASS-SPECTROMETRY
    GRASSERBAUER, M
    JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1988, 93 (03): : 510 - 518
  • [43] MOLECULAR SECONDARY ION MASS-SPECTROMETRY
    DAY, RJ
    UNGER, SE
    COOKS, RG
    ANALYTICAL CHEMISTRY, 1980, 52 (04) : A557 - &
  • [44] SECONDARY ION MASS-SPECTROMETRY OF OLIGOPEPTIDES
    BEAVIS, R
    ENS, W
    STANDING, KG
    WESTMORE, JB
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 46 (JAN): : 471 - 474
  • [45] QUADRUPOLES FOR SECONDARY ION MASS-SPECTROMETRY
    DAWSON, PH
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1975, 17 (04): : 447 - 467
  • [46] SECONDARY ION MASS-SPECTROMETRY OF SEMICONDUCTORS
    WILSON, RG
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 463 : 86 - 87
  • [47] SECONDARY ION MASS-SPECTROMETRY (SIMS)
    STUCK, R
    SIFFERT, P
    PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1984, 8 (1-2): : 11 - 57
  • [48] SECONDARY-ION MASS-SPECTROMETRY
    GRASSERBAUER, M
    CHEMIE IN UNSERER ZEIT, 1994, 28 (05) : 222 - 232
  • [49] SECONDARY ION MASS-SPECTROMETRY OF POLYMERS
    CAMPANA, JE
    ROSE, SL
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 46 (JAN): : 483 - 486
  • [50] SECONDARY-ION MASS-SPECTROMETRY
    ZALM, PC
    VACUUM, 1994, 45 (6-7) : 753 - 772
12345