共 50 条
- [34] HALF-THICKNESS ESTIMATION FOR LONG-WAVE CONTINUOUS-SPECTRUM X RAYS IN BROAD-BEAM GEOMETRY. The Soviet journal of nondestructive testing, 1986, 22 (08): : 527 - 529
- [35] HALF-THICKNESS ESTIMATION FOR LONG-WAVE CONTINUOUS-SPECTRUM X-RAYS IN BROAD-BEAM GEOMETRY SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR, 1986, 22 (08): : 527 - 529
- [38] Approximation of the plasma inhomogeneity by broad-beam measurements and simulation REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (02): : 678 - 680
- [39] SURFACE FILM THICKNESS DETERMINATION BY REFLECTANCE MEASUREMENTS APPLIED OPTICS, 1973, 12 (06): : 1271 - 1275
- [40] DETERMINATION OF BODY COMPOSITION BY TRANSMISSION MEASUREMENTS BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1971, 16 (10): : 1160 - +