SECONDARY ION MASS-SPECTROMETRY - EMPIRICAL QUANTIFICATION TECHNIQUES AND THEIR APPLICATION

被引：0

作者：

CHRISTIE, WH ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,OAK RIDGE,TN 37830

来源：

ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1981年 / 181卷 / MAR期

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：143 / ANYL

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