BAYESIAN-ESTIMATION UNDER EXPONENTIAL FAILURE DISTRIBUTION

被引：0
|
作者：
JAISINGH, LR
机构：
[1] Department of Mathematical Sciences, Morehead State University, Morehead
来源：
MICROELECTRONICS AND RELIABILITY | 1991年 / 31卷 / 06期
关键词：
Bayesian estimators - Exponential distributions - Failure distributions - Max likelihood estimators;
D O I：
10.1016/0026-2714(91)90313-V
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The adhoc reliability of a series system with p- independent components is estimated. The life distribution for component i is assumed to have an exponential distribution with parameter theta(i). The reliability of the system reduces to a function, xi, of theta = (theta(i), theta(2), ..., theta(p)). The maximum likelihood estimator and the Bayes estimator for component i of xi are derived. The Bayes estimate is obtained using a special asymmetric loss function. The maximum likelihood estimator and the Bayes estimator for component i of xi are compared using a nearness criterion.
引用
收藏
页码：1229 / 1235
页数：7
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