SAMPLING INSPECTION IN SEMI-MARKOV SYSTEMS

被引：0
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作者：
ANISIMOV, VV
SEREDA, VI
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来源：
CYBERNETICS | 1989年 / 25卷 / 03期
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中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
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页码：400 / 408
页数：9
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