STUDY OF CRYSTALLIZATION DEFECTS IN FEF3 THIN-FILMS BY MOSSBAUER SPECTROMETRY

被引：2
|
作者：
BARRIERE, AS
LACHTER, A
GIANDUZZO, JC
MENIL, F
机构：
来源：
JOURNAL OF CRYSTAL GROWTH | 1981年 / 52卷 / APR期
关键词：
D O I：
10.1016/0022-0248(81)90410-3
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
收藏
页码：989 / 994
页数：6
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