TESTING ANALOG CIRCUITS BY POWER-SUPPLY VOLTAGE CONTROL

被引：9

作者：

AAIN, AKB

BRATT, AH

DOREY, AP

机构：

[1] Microelectronic research group, Engineering Department, University of Lancaster

来源：

ELECTRONICS LETTERS | 1994年 / 30卷 / 03期

关键词：

ANALOG CIRCUITS; TESTING; INTEGRATED CIRCUITS;

D O I：

10.1049/el:19940123

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

By varying the power supply voltages of an analogue integrated circuit as a testing technique it is possible to expose faults within the circuits which are difficult to detect by conventional input voltage stimulation. This technique is simple to implement and does not incur any area overhead penalty.

引用

页码：214 / 215

页数：2

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