CHARACTERIZATION OF DEEP TRAPS IN SEMI-INSULATING GAAS AND INP BY PHOTOINDUCED TRANSIENT SPECTROSCOPY (PITS)

被引：0
|
作者：
KAMINSKI, P [1 ]
THOMAS, H [1 ]
机构：
[1] UNIV COLL CARDIFF,CARDIFF CF1 1XL,S GLAM,WALES
来源：
ACTA PHYSICA POLONICA A | 1990年 / 77卷 / 01期
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D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：87 / 90
页数：4
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