ROLE OF CARBON-FILM THICKNESS IN ELECTRON-MICROPROBE ANALYSIS - COMMENT

被引：0
|
作者：
SPRINGER, G [1 ]
机构：
[1] FALCONBRIDGE MET LABS,THORNHILL L3T 4A8,ONTARIO,CANADA
来源：
AMERICAN MINERALOGIST | 1974年 / 59卷 / 9-10期
关键词：
D O I：
暂无
中图分类号：
P3 [地球物理学]; P59 [地球化学];
学科分类号：
0708 ; 070902 ;
摘要：
引用
收藏
页码：1121 / 1122
页数：2
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