INDUCTIVE EDDY-CURRENT SENSOR WITH A TEMPERATURE COMPENSATED COIL SYSTEM

被引：5

|

作者：

BECKER, WJ

机构：

来源：

ARCHIV FUR ELEKTROTECHNIK | 1990年 / 73卷 / 03期

关键词：

D O I：

10.1007/BF01574025

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：181 / 192

页数：12

相关论文

共 50 条

[21] PROBE COIL EDDY-CURRENT TESTING OF MOVING FLAT OBJECTS
KOSTADINOV, PZ
TZMELKOV, DN
DENEV, MB
MATERIALS EVALUATION, 1985, 43 (10) : 1303 - 1303
[22] Estimation of defect depth on plates by eddy-current coil array
Xia, Zihan
Huang, Ruochen
Shao, Yuchun
Bai, Xue
Yin, Wuliang
SENSORS AND ACTUATORS A-PHYSICAL, 2024, 369
[23] EDDY-CURRENT DISTRIBUTION IN A CONDUCTING PLATE FOR PENETRATING EXCITING COIL
BEYSE, V
ARCHIV FUR ELEKTROTECHNIK, 1976, 58 (06): : 309 - 314
[24] OPTIMIZATION OF EDDY-CURRENT MEASUREMENTS OF COIL-TO-CONDUCTOR SPACING
SMITH, JH
DODD, CV
MATERIALS EVALUATION, 1975, 33 (12) : 279 - &
[25] Eddy-current interaction of a long coil with a slot in a conductive plate
Theodoulidis, T
Bowler, J
IEEE TRANSACTIONS ON MAGNETICS, 2005, 41 (04) : 1238 - 1247
[26] A STUDY OF EDDY-CURRENT EFFECTS IN THE STRUCTURE OF THE WESTINGHOUSE LCT COIL
LUTON, JN
SHEN, SS
MCMANAMY, TJ
WILSON, CT
ELLIS, JF
DRESNER, L
WINTENBERG, RE
IEEE TRANSACTIONS ON MAGNETICS, 1987, 23 (02) : 1497 - 1500
[27] ANALYTICAL SOLUTIONS TO EDDY-CURRENT PROBE-COIL PROBLEMS
DODD, CV
DEEDS, WE
JOURNAL OF APPLIED PHYSICS, 1968, 39 (06) : 2829 - &
[28] THE INHERENT GEOMETRY OF EDDY-CURRENT SYSTEM
BALDOMIR, D
JOURNAL OF APPLIED PHYSICS, 1993, 73 (10) : 5452 - 5452
[29] Inherent geometry of eddy-current system
1600, (73):
[30] MECHANIZED EDDY-CURRENT SCANNING SYSTEM
REEVES, CR
MATERIALS EVALUATION, 1972, 30 (09) : A38 - &

← 1 2 3 4 5 →