Asymmetric Underlap Dual Material Gate DG-FET for Low Power Analog/RF Applications

被引:2
|
作者
Kundu, Atanu [1 ]
Dutta, Arka [2 ]
Sarkar, Chandan K. [2 ]
机构
[1] Heritage Inst Technol, Dept Elect & Commun Engn, Kolkata 700107, India
[2] Jadavpur Univ, Dept Elect & Telecommun Engn, Nano Device Simulat Lab, Kolkata 700032, India
关键词
Analog Performance; RF Performance; Underlap DG MOSFET; Dual Metal Gate; Carrier Transport;
D O I
10.1166/jolpe.2015.1415
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a systematic comparative study on effect of asymmetric spacer, on Analog/RF performance of Asymmetric Underlap (ASYM-UDL) Dual Material Gate (DMG) DG NMOSFETs. The asymmetric spacer in ASYM-UDLDMG DG NMOSFETs is proposed for the first time and the performance improvement of the device is compared with the Symmetry Underlap (SYM-UDL) DMG DG NMOSFET having symmetric spacer. The performance of the devices is compared in relation to the analog/RF parameters, the on current (I-on), the transconductance (g(m)), the transconductance generation factor (g(m)/I-d), the intrinsic gain (g(m)R(o)), the intrinsic capacitances, the intrinsic resistances, the transport delay and the inductance. The analysis suggested that the average I-on, g(m), and g(m)R(o), increases by 62.150%, 53.113% and 30.837% respectively compared to the SYM-UDL DMG DG NMOSFET.
引用
收藏
页码:509 / 516
页数:8
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