ION-BEAM PROBING SYSTEM FOR LABORATORY PLASMAS

被引：0
|
作者：
REINOVSKY, RE [1 ]
JENNINGS, WC [1 ]
HICKOK, R [1 ]
机构：
[1] RENSSELAER POLYTECH INST, TROY, NY USA
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1972年 / 17卷 / 11期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：985 / 986
页数：2
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