SELF-CONSISTENT CALCULATION OF COMPTON PROFILES, X-RAY STRUCTURE FACTORS, AND BAND-STRUCTURE FOR SILICON

被引:10
|
作者
HEATON, JM [1 ]
LAFON, E [1 ]
机构
[1] OKLAHOMA STATE UNIV,DEPT PHYS,STILLWATER,OK 74078
来源
关键词
D O I
10.1088/0022-3719/14/4/010
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
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页码:347 / 351
页数:5
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