STRUCTURAL STUDY BY ELECTRON-DIFFRACTION ON AMORPHOUS SE100-XBIX FILMS

被引:5
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MUNOZ, A
CUMBRERA, FL
MARQUEZ, R
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10.1016/0167-577X(88)90170-X
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T [工业技术];
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08 ;
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页码:138 / 142
页数:5
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