NATURE OF VICINAL LASER-ANNEALED SI(111) SURFACES

被引：32
|
作者：
CHABAL, YJ
ROWE, JE
CHRISTMAN, SB
机构：
来源：
PHYSICAL REVIEW B | 1981年 / 24卷 / 06期
关键词：
D O I：
10.1103/PhysRevB.24.3303
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
下载
收藏
页码：3303 / 3309
页数：7
相关论文
共 50 条
  • [1] SIMILARITY OF THE LASER-ANNEALED AND THERMALLY ANNEALED SI(111) SURFACES
    ZEHNER, DM
    WHITE, CW
    HEIMANN, P
    REIHL, B
    HIMPSEL, FJ
    EASTMAN, DE
    PHYSICAL REVIEW B, 1981, 24 (08): : 4875 - 4878
  • [2] BUCKLING RECONSTRUCTION ON LASER-ANNEALED SI(111) SURFACES
    CHABAL, YJ
    ROWE, JE
    ZWEMER, DA
    PHYSICAL REVIEW LETTERS, 1981, 46 (09) : 600 - 603
  • [3] LUMINESCENCE INVESTIGATIONS OF LASER-ANNEALED SI
    MIZUTA, M
    SHENG, NH
    MERZ, JL
    APPLIED PHYSICS LETTERS, 1981, 38 (06) : 453 - 455
  • [4] BUCKLING RECONSTRUCTION ON LASER ANNEALED SI(111) SURFACES
    CHABAL, YJ
    ROWE, JE
    CHRISTMAN, SB
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1981, 26 (03): : 351 - 351
  • [5] CHARACTERIZATION OF SURFACES OF LASER-ANNEALED SAMPLES BY ELLIPSOMETRY
    MUSHAKARARA, SC
    VEDAM, K
    SURFACE SCIENCE, 1980, 96 (1-3) : 319 - 328
  • [6] ELECTRONIC-STRUCTURE OF THE LASER-ANNEALED SI(111) X-1 SURFACE
    OFNER, H
    ULRYCH, I
    CHAB, V
    NETZER, FP
    MATTHEW, JAD
    SURFACE SCIENCE, 1995, 327 (03) : 233 - 240
  • [7] CHARACTERIZATION OF LASER-ANNEALED SI LAYERS BY ELLIPSOMETRY
    NAKAMURA, K
    KAMOSHIDA, M
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1979, 42 (1-2): : 29 - 34
  • [8] COMPARISON OF CW LASER-ANNEALED AND ELECTRON-BEAM ANNEALED SI
    MIZUTA, M
    SHENG, NH
    MERZ, JL
    JOURNAL OF APPLIED PHYSICS, 1981, 52 (10) : 6437 - 6440
  • [9] Surface melting of vicinal Si(111) surfaces
    Natori, A
    Harada, H
    SURFACE SCIENCE, 1999, 438 (1-3) : 162 - 172
  • [10] ABOUT THE SUBLIMATION OF SI SURFACES VICINAL OF (111)
    ALFONSO, C
    HEYRAUD, JC
    METOIS, JJ
    SURFACE SCIENCE, 1993, 291 (1-2) : L745 - L749
12345