PROBE CALIBRATION IN MAGNETIC FORCE MICROSCOPY

被引：57
|
作者：
GODDENHENRICH, T
LEMKE, H
MUCK, M
HARTMANN, U
HEIDEN, C
机构：
[1] Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich, D-5170 Jülich
来源：
APPLIED PHYSICS LETTERS | 1990年 / 57卷 / 24期
关键词：
D O I：
10.1063/1.103827
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Quantitative image interpretation in magnetic force microscopy requires information about the geometric and magnetic configuration of the employed microprobe. If the magnetic microfield of a given sample is known in detail, a calibration of the probe is possible. Using the well-defined current-induced microfield of a nanolithographically structured conducting pattern, calibration measurements combined with model calculations provide an insight into the effective domain configuration of magnetic force microscopy probes.
引用
收藏
页码：2612 / 2614
页数：3
相关论文
共 50 条
  • [1] Method for the calibration of magnetic force microscopy tips
    van, Schendel, P.J.A.
    Hug, H.J.
    Stiefel, B.
    Martin, S.
    Guntherodt, H.-J.
    [J]. Journal of Applied Physics, 2000, 88 (01)
  • [2] A method for the calibration of magnetic force microscopy tips
    van Schendel, PJA
    Hug, HJ
    Stiefel, B
    Martin, S
    Güntherodt, HJ
    [J]. JOURNAL OF APPLIED PHYSICS, 2000, 88 (01) : 435 - 445
  • [3] The CantiClever: a dedicated probe for magnetic force microscopy
    van den Bos, A
    Heskamp, I
    Siekman, M
    Abelmann, L
    Lodder, C
    [J]. IEEE TRANSACTIONS ON MAGNETICS, 2002, 38 (05) : 2441 - 2443
  • [4] Magnetic resonance force microscopy with a paramagnetic probe
    Berman, G. P.
    Gorshkov, V. N.
    Tsifrinovich, V. I.
    [J]. PHYSICS LETTERS A, 2017, 381 (16) : 1445 - 1448
  • [5] Force microscopy - Magnetic tips probe the nanoworld
    Meyer, Ernst
    Rast, Simon
    [J]. NATURE NANOTECHNOLOGY, 2007, 2 (05) : 267 - 268
  • [6] Dynamic Probe Calibration for Quantitative Measurements with Atomic Force Microscopy
    Belikov, Sergey
    Alexander, John
    Magonov, Sergei
    [J]. 2018 ANNUAL AMERICAN CONTROL CONFERENCE (ACC), 2018, : 5100 - 5105
  • [7] Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy-magnetic force microscopy combination
    Jaafar, Miriam
    Iglesias-Freire, Oscar
    Serrano-Ramon, Luis
    Ricardo Ibarra, Manuel
    Maria de Teresa, Jose
    Asenjo, Agustina
    [J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2011, 2 : 552 - 560
  • [8] Applications of tip calibration in magnetic force microscopy (MFM)
    Van Schendel, PJA
    Hug, HJ
    Hoffmann, R
    Martin, S
    Kappenberger, P
    Lantz, MA
    Güntherodt, HJ
    [J]. MAGNETIC STORAGE SYSTEMS BEYOND 2000, 2001, 41 : 313 - 316
  • [9] Magnetic force microscopy in the presence of a strong probe field
    Lee, Inhee
    Kim, Jongjoo
    Obukhov, Yuri
    Banerjee, Palash
    Xiang, Gang
    Pelekhov, Denis V.
    Hauser, Adam
    Yang, Fengyuan
    Hammel, P. Chris
    [J]. APPLIED PHYSICS LETTERS, 2011, 99 (16)
  • [10] Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopy
    Chung, Koo-Hyun
    Shaw, Gordon A.
    Pratt, Jon R.
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2009, 80 (06):
12345