共 50 条
- [44] A FAULT MODEL FOR MULTIVALUED NMOS DYNAMIC RANDOM-ACCESS MEMORIES [J]. MICROELECTRONICS AND RELIABILITY, 1989, 29 (02): : 137 - 143
- [50] Permuting Data on Random-Access Block Storage [J]. PROCEEDINGS OF THE VLDB ENDOWMENT, 2013, 6 (09): : 721 - 732