RADIOTRACER MEASUREMENTS OF SODIUM PENETRATION THROUGH THIN-FILMS OF PHOSPHOSILICATE GLASS

被引：0

作者：

DUNTON, SV

LING, AC

VANDENHOEK, GM

机构：

[1] SAN JOSE STATE UNIV,DEPT CHEM,SAN JOSE,CA 95192

[2] SIGNET CORP,PHILIPS RES LABS SUNNYVALE,SUNNYVALLE,CA 94088

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1988年 / 135卷 / 08期

关键词：

D O I：

暂无

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：C363 / C363

页数：1

共 50 条

[41] DIELECTRIC RELAXATION IN LAYERED THIN FILMS OF PHOSPHOSILICATE GLASS AND SIO2
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[50] THE USE OF NUCLEAR TECHNIQUES FOR THE ANALYSIS OF THIN-FILMS ON GLASS
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