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RADIOTRACER MEASUREMENTS OF SODIUM PENETRATION THROUGH THIN-FILMS OF PHOSPHOSILICATE GLASS
被引:0
|
作者
:
DUNTON, SV
论文数:
0
引用数:
0
h-index:
0
机构:
SAN JOSE STATE UNIV,DEPT CHEM,SAN JOSE,CA 95192
DUNTON, SV
LING, AC
论文数:
0
引用数:
0
h-index:
0
机构:
SAN JOSE STATE UNIV,DEPT CHEM,SAN JOSE,CA 95192
LING, AC
VANDENHOEK, GM
论文数:
0
引用数:
0
h-index:
0
机构:
SAN JOSE STATE UNIV,DEPT CHEM,SAN JOSE,CA 95192
VANDENHOEK, GM
机构
:
[1]
SAN JOSE STATE UNIV,DEPT CHEM,SAN JOSE,CA 95192
[2]
SIGNET CORP,PHILIPS RES LABS SUNNYVALE,SUNNYVALLE,CA 94088
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1988年
/ 135卷
/ 08期
关键词
:
D O I
:
暂无
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:C363 / C363
页数:1
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